absolute maximum ratings parameter units i d @ v gs = 12v, t c = 25c continuous drain current 53.5 i d @ v gs = 12v, t c = 100c continuous drain current 34 i dm pulsed drain current ? 214 p d @ t c = 25c max. power dissipation 250 w linear derating factor 2.0 w/c v gs gate-to-source voltage 20 v e as single pulse avalanche energy ? 380 mj i ar avalanche current ? 53.5 a e ar repetitive avalanche energy ? 25 mj dv/dt p eak diode recovery dv/dt ? 9.2 v/ns t j operating junction -55 to 150 t stg storage temperature range pckg. mounting surface temp. 300 (for 5s) weight 3.3 (typical) g pre-irradiation international rectifier?s r5 tm technology provides high performance power mosfets for space appli- cations. these devices have been characterized for single event effects (see) with useful performance up to an let of 80 (mev/(mg/cm 2 )). the combination of low r ds(on) and low gate charge reduces the power losses in switching applications such as dc to dc converters and motor control. these devices retain all of the well established advantages of mosfets such as voltage control, fast switching, ease of paral- leling and temperature stability of electrical param- eters. o c a 09/10/03 www.irf.com 1 smd-2 features: single event effect (see) hardened ultra low r ds(on) low total gate charge proton t olerant simple drive requirements ease of paralleling hermetically sealed surface mount ceramic package light weight for footnotes refer to the last page radiation hardened jansr2n7473u2 power mosfet 200v, n channel thru-hole (smd-2) ref:mil-prf-19500/684 technology IRHNA57260SE product summary part number radiation level r ds(on) i d qpl part number IRHNA57260SE 100k rads (si) 0.038 ? 53.5a jansr2n7473u2 pd - 91839h
IRHNA57260SE, jansr2n7473u2 pre -irradiation 2 www.irf.com electrical characteristics @ tj = 25c (unless otherwise specified) parameter min typ max units test conditions bv dss drain-to-source breakdown voltage 200 ? ? v v gs = 0v, i d = 1.0ma ? bv dss / ? t j temperature coefficient of breakdown ? 0.26 ? v/c reference to 25c, i d = 1.0ma voltage r ds(on) static drain-to-source on-state ? ? 0.038 ? v gs = 12v, i d = 34a resistance v gs(th) gate threshold voltage 2.5 ? 4.5 v v ds = v gs , i d = 1.0ma g fs forward transconductance 35 ? ? s ( ) v ds > 15v, i ds = 34a ? i dss zero gate voltage drain current ? ? 10 v ds = 160v ,v gs =0v ??25 v ds = 160v, v gs = 0v, t j = 125c i gss gate-to-source leakage forward ? ? 100 v gs = 20v i gss gate-to-source leakage reverse ? ? -100 v gs = -20v q g total gate charge ? ? 155 v gs =12v, i d = 34a q gs gate-to-source charge ? ? 45 nc v ds = 100v q gd gate-to-drain (?miller?) charge ? ? 75 t d (on) turn-on delay time ? ? 35 v dd = 100v, i d = 34a, t r rise time ? ? 125 v gs =12v, r g = 2.35 ? t d (off) turn-off delay time ? ? 80 t f fall time ? ? 50 l s + l d total inductance ? 4.0 ? c iss input capacitance ? 6044 ? v gs = 0v, v ds = 25v c oss output capacitance ? 913 ? p f f = 1.0mhz c rss reverse transfer capacitance ? 65 ? na ? ? nh ns a thermal resistance parameter min typ max units t est conditions r thjc junction-to-case ? ? 0.5 r thj-pcb junction-to-pc board ? 1.6 ? soldered to a 2? square copper-clad board c/w measured from the center of drain pad to center of source pad source-drain diode ratings and characteristics parameter min typ max units t est conditions i s continuous source current (body diode) ? ? 53.5 i sm pulse source current (body diode) ? ? ? 214 v sd diode forward voltage ? ? 1.2 v t j = 25c, i s = 53.5a, v gs = 0v ? t rr reverse recovery time ? ? 450 ns t j = 25c, i f = 34a, di/dt 100a/ s q rr reverse recovery charge ? ? 7.0 cv dd 25v ? t on forward tu rn-on time intrinsic turn-on time is negligible. turn-on speed is substantially controlled by l s + l d . a note: corresponding spice and saber models are available on internaional rectifier website. for footnotes refer to the last page
www.irf.com 3 IRHNA57260SE, jansr2n7473u2 table 1. electrical characteristics @ tj = 25c, post total dose irradiation ?? international rectifier radiation hardened mosfets are tested to verify their radiation hardness capability. the hardness assurance program at international rectifier is comprised of two radiation environments. every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the t o-3 package. both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions in order to provide a direct comparison. radiation characteristics fig a. single event effect, safe operating area international rectifier radiation hardened mosfets have been characterized in heavy ion environment for single event effects (see). single event effects characterization is illustrated in fig. a and table 2. table 2. single event effect safe operating area for footnotes refer to the last page parameter 100k rads (si) units test conditions min max bv dss drain-to-source breakdown voltage 200 ? v v gs = 0v, i d = 1.0ma v gs(th) gate threshold voltage 2.0 4.5 v gs = v ds , i d = 1.0ma i gss gate-to-source leakage forward ? 100 na v gs = 20v i gss gate-to-source leakage reverse ? -100 v gs = -20v i dss zero gate voltage drain current ? 10 a v ds =160v, v gs =0v r ds(on) static drain-to-source on-state resistance (to-3) ? 0.039 ? v gs = 12v, i d = 34a r ds(on) static drain-to-source v sd diode forward voltage ? 1.2 v v gs = 0v, i d = 45a on-state resistance (smd-2) ? 0.038 ? v gs = 12v, i d = 34a ion let energy range v ds (v) mev/(mg/cm 2 )) (mev) (m) @v gs =0v @v gs =-5v @v gs =-10v @v gs =-15v @v gs =-20v br 36.7 309 39.5 200 200 200 200 200 i 59.8 341 32.5 200 200 200 185 120 au 82.3 350 28.4 200 200 150 50 25 0 50 100 150 200 250 0-5-10-15-20 vgs vds br i au
IRHNA57260SE, jansr2n7473u2 pre -irradiation 4 www.irf.com fig 4. normalized on-resistance vs. temperature fig 2. typical output characteristics fig 1. typical output characteristics fig 3. typical transfer characteristics 15 0.1 1 10 100 1000 0.1 1 10 100 20s pulse width t = 25 c j top bottom vgs 15v 12v 10v 9.0v 8.0v 7.0v 6.0v 5.0v v , drain-to-source volta g e (v) i , drain-to-source current (a) ds d 5.0v 0.1 1 10 100 1000 0.1 1 10 100 20 s pulse width t = 150 c j top bottom vgs 15v 12v 10v 9.0v 8.0v 7.0v 6.0v 5.0v v , drain-to-source voltage (v) i , drain-to-source current (a) ds d 5.0v 1 10 100 1000 5.0 6.0 7.0 8.0 9.0 10.0 v = 50v 20 s pulse width ds v , gate-to-source voltage (v) i , drain-to-source current (a) gs d t = 25 c j t = 150 c j -60 -40 -20 0 20 40 60 80 100 120 140 160 0.0 0.5 1.0 1.5 2.0 2.5 3.0 t , junction temperature ( c) r , drain-to-source on resistance (normalized) j ds(on) v = i = gs d 12v 55a 12v 53.5a
www.irf.com 5 IRHNA57260SE, jansr2n7473u2 fig 8. maximum safe operating area fig 6. typical gate charge vs. gate-to-source voltage fig 5. typical capacitance vs. drain-to-source voltage fig 7. typical source-drain diode forward voltage 1 10 100 0 2000 4000 6000 8000 10000 v , drain-to-source voltage (v) c, capacitance (pf) ds v c c c = = = = 0v, c c c f = 1mhz + c + c c shorted gs iss g s g d , ds rss g d oss ds g d c iss c oss c rss 0 25 50 75 100 125 150 175 200 0 5 10 15 20 q , total gate charge (nc) v , gate-to-source voltage (v) g gs for test circuit see figure i = d 13 55 a v = 40v ds v = 100v ds v = 160v ds 0.1 1 10 100 1000 0.2 0.4 0.6 0.8 1.0 1.2 1.4 v ,source-to-drain volta g e (v) i , reverse drain current (a) sd sd v = 0 v gs t = 25 c j t = 150 c j pre-irradiation 34a
i d , drain-to-source current (a)
! operation in this area limited by rds ( on ) !
IRHNA57260SE, jansr2n7473u2 pre -irradiation 6 www.irf.com fig 10a. switching time test circuit v ds 90% 10% v gs t d(on) t r t d(off) t f fig 10b. switching time waveforms v ds pulse width 1 s duty factor 0.1 % r d v gs r g d.u.t. + - v dd fig 11. maximum effective transient thermal impedance, junction-to-case fig 9. maximum drain current vs. case temperature 25 50 75 100 125 150 0 10 20 30 40 50 60 t , case temperature ( c) i , drain current (a) c d v gs 0.001 0.01 0.1 1 0.00001 0.0001 0.001 0.01 0.1 1 notes: 1. dut y factor d = t / t 2. peak t = p x z + t 1 2 j dm thjc c p t t dm 1 2 t , rectangular pulse duration (sec) thermal response (z ) 1 thjc 0.01 0.02 0.05 0.10 0.20 d = 0.50 single pulse ( thermal response )
www.irf.com 7 IRHNA57260SE, jansr2n7473u2 q g q gs q gd v g charge d.u.t. v ds i d i g 3ma v gs .3 f 50k ? .2 f 12v current regulator same type as d.u.t. current sampling resistors + - 12 v fig 13b. gate charge test circuit fig 13a. basic gate charge waveform fig 12c. maximum avalanche energy vs. drain current fig 12b. unclamped inductive waveforms fig 12a. unclamped inductive test circuit t p v (br)dss i as 25 50 75 100 125 150 0 200 400 600 800 starting t , junction temperature ( c) e , single pulse avalanche energy (mj) j as i d top bottom 24a 34a 53.5a pre-irradiation . r g i as 0.01 ? t p d.u.t l v ds + - v dd driver a 15v 20v . v gs
IRHNA57260SE, jansr2n7473u2 pre -irradiation 8 www.irf.com ? pulse width 300 s; duty cycle 2% ? total dose irradiation with v gs bias. 12 volt v gs applied and v ds = 0 during irradiation per mil-std-750, method 1019, condition a. ? total dose irradiation with v ds bias. 160 volt v ds applied and v gs = 0 during irradiation per mll-std-750, method 1019, condition a. ? repetitive rating; pulse width limited by maximum junction temperature. ? v dd = 50v, starting t j = 25c, l= 0.27 mh peak i l = 53.5a, v gs = 12v ? i sd 53.5a, di/dt 190a/ s, v dd 200v, t j 150c footnotes: case outline and dimensions ? smd-2 ir world headquarters: 233 kansas st., el segundo, california 90245, usa tel: (310) 252-7105 ir leominster : 205 crawford st., leominster, massachusetts 01453, usa tel: (978) 534-5776 tac fax: (310) 252-7903 visit us at www.irf.com for sales contact information . data and specifications subject to change without notice. 09/03
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